Difference between revisions of "X-Ray Fluorescence Spectrometers"
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X-Ray Fluorescence Spectrometer is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples. | |||
X-ray fluorescence spectrometer is capable of measuring elements from beryllium (Be) to uranium (U) and beyond at trace levels often below one part per million and up to 100%. | |||
The X-ray fluorescence spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays.X-ray fluorescence is the emission of characteristic secondary X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for element analysis | |||
and chemical analysis, particularly in the investigation of metals, glass, | |||
ceramics and building materials, and for research ingeochemistry, forensic science and archaeology. | |||
Revision as of 06:31, 25 December 2012
X-Ray Fluorescence Spectrometer is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples. X-ray fluorescence spectrometer is capable of measuring elements from beryllium (Be) to uranium (U) and beyond at trace levels often below one part per million and up to 100%. The X-ray fluorescence spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays.X-ray fluorescence is the emission of characteristic secondary X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for element analysis
and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research ingeochemistry, forensic science and archaeology.